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Natural Science Forum / Physics / Optics / December 2005



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features visible at low magnification are not "clear" at high magnification

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sanjiv - 19 Dec 2005 01:37 GMT
Dear microscopist,

I think i have a relatively simple problem for the experts in
optical microscopy.

I'm looking at indentation in hard ceramics [opaque material] using
simple optical microscope with x10,x20,x50,x100 using yellow light,
observing in reflection mode.

The problem I have is at low magnification x10 around the indents a
ring like feature is visible, however at high magnification x50 or
x100 the features is not visible. The lateral size of the indents
ranges from 30um to 200um. measurements by different techniques
(AFM) the vertical depth of indents range from 2um - expected 15ums.
The ring like features ranges in height from few(10-50) nanometers
to about 1ums.

I would appreciate comments, literature, references etc. explaining
this effect.

since, images can not be posted, i would gladly give images for indpeth
response.

thanking you for the help.

Warm regards
Sanjiv
GTO - 19 Dec 2005 02:11 GMT
What type of microscope are you using? Stereozoom or compound microscope?
Does your EPI illuminator support Koehler type illumination? What does it
mean 10x, 20x, 100x? Please list the resolution, not the magnification since
magnification is not too relevant to microscopists. Resolution and contrast
are the bread and butter. For instance, if you increase magnification by
just increasing the magnification of your oculars you will NOT increase
resolution. Hence an image that appears crisp and sharp at lower
magnification suddenly appears washed out.

Gregor

> Dear microscopist,
>
[quoted text clipped - 23 lines]
> Warm regards
> Sanjiv
GTO - 19 Dec 2005 02:26 GMT
Just in case:

http://www.microscopyu.com/articles/formulas/formulasindex.html

and especially

http://www.microscopyu.com/articles/formulas/formulasresolution.html

Gregor

> What type of microscope are you using? Stereozoom or compound microscope?
> Does your EPI illuminator support Koehler type illumination? What does it
[quoted text clipped - 34 lines]
>> Warm regards
>> Sanjiv
jacques jedwab - 19 Dec 2005 09:20 GMT
I can't tell you much about the "why's", but here is a trick about "how to
make it visible": you just vaporize a very thin layer of carbon with a
vacuum sputtering machine, such as used by SEM and EMP techniques. Your
indentation will become neatly visible under reflected light microscopy.

J.J.

> Dear microscopist,
>
[quoted text clipped - 23 lines]
> Warm regards
> Sanjiv
Gary G - 20 Dec 2005 04:20 GMT
>I can't tell you much about the "why's", but here is a trick about "how to
>make it visible": you just vaporize a very thin layer of carbon with a
>vacuum sputtering machine, such as used by SEM and EMP techniques. Your
>indentation will become neatly visible under reflected light microscopy.
>
>J.J.

I do this all the time.  However, I use a coating of Au/Pd.  The
coating makes a big difference when viewed optically.  Under SEM,
it makes little difference.

Gary Gaugler, Ph.D.
Microtechnics, Inc.
Granite Bay, CA 95746
916.791.8191
gary@microtechnics dot com
Gary G - 20 Dec 2005 05:17 GMT
>>I can't tell you much about the "why's", but here is a trick about "how to
>>make it visible": you just vaporize a very thin layer of carbon with a
[quoted text clipped - 6 lines]
>coating makes a big difference when viewed optically.  Under SEM,
>it makes little difference.

As a note, this technique is used for examinining stress cracks,
separatation fractures and other issues that do not show up
monumentally under SEM.  The thin (80A) coating really makes a
difference.

Gary Gaugler, Ph.D.
Microtechnics, Inc.
Granite Bay, CA 95746
916.791.8191
gary@microtechnics dot com
rene - 19 Dec 2005 12:25 GMT
I suppose the boundary of the indentation becomes more 'stretched' with
higher mag, therefore less easy to detect. Compare with the more
contrast rich image from a lower mag eyepiece.

HTH, Rene.
Kevin Cunningham - 19 Dec 2005 13:36 GMT
> Dear microscopist,
>
[quoted text clipped - 23 lines]
> Warm regards
> Sanjiv

Sounds like its time to use reflected dark field.  You might have to upgrade
your microscope.

Kevin Cunningham
SMS
Aaron - 29 Dec 2005 01:11 GMT
Kevin is correct. But you may not have to have darkfield objectives.
The basis of epi-darkfield is lighting at an oblique angle from the
side.  You may be able to duplicate the effect by turning off the main
light source and using another light source aimed at the specimen from
an angle outside the objective.

Aaron

>> Dear microscopist,
>>
[quoted text clipped - 29 lines]
>Kevin Cunningham
>SMS
Gary G - 29 Dec 2005 01:38 GMT
>Dear microscopist,
>
[quoted text clipped - 23 lines]
>Warm regards
>Sanjiv

If you can tolerate destructive action on your sample, sputter coating
with 60A Au/Pd will make the specimen look quite different under LM.

Gary Gaugler, Ph.D.
Microtechnics, Inc.
Granite Bay, CA 95746
916.791.8191
gary@microtechnics dot com
Aaron - 29 Dec 2005 02:49 GMT
Hi Gary,

Doubtless you are correct.  However, in this case, I get the feeling
that the equipment to sputter coat the specimen is just as
out-of-reach as the darkfield epi- objectives.   I wonder if another
type of coating might do the same thing, say a thin coating of paint
or perhaps a dilute carbon balck suspension.

Aaron  

>>Dear microscopist,
>>
[quoted text clipped - 32 lines]
>916.791.8191
>gary@microtechnics dot com
Gary G - 29 Dec 2005 04:40 GMT
>Hi Gary,
>
[quoted text clipped - 5 lines]
>
>Aaron  

Aaron:

The coating is only a few tens of Angstroms thick.

Another type???
I don't think so.  Too bad, however.  The ability of the sputter coat
to adhere to and enhance morphology is quite unique and stunning.  A
regular specimen w/o coating is likely to be near impossible to
evaluate.  With just a thin coating, the whole scene changes.  This is
a key tool in forensics analysis. In this case, forensics includes
metallurgical failure.

Alumina is a big reflector.  The coating stops this and yields many LM
data points.  Then, in the SEM, even more is found.  After that, image
processing produces even more data...if it is there to be found.  If
not coated, VPSEM EBSD can show grain anomalies that otherwise would
never be found or noticed.  The challenge is to sort out what the EBSD
data says.  Not always trivial.

Just for the record, one must not coat alumina with Au/Pd or other
metals to get good EBSD patterns.  This will not happen.  Thin C is
preferred.  The other option is VPSE.

Gary Gaugler, Ph.D.
Microtechnics, Inc.
Granite Bay, CA 95746
916.791.8191
gary@microtechnics dot com
 
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